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https://www.researchgate.net/publication/4115149_Intelligible_test_techniques_to_support_error-tolerance
We introduce the concept of error-tolerance, and mention related issues needed to support this concept, including ways for specifying performance, design techniques that consider yield, test ...
https://www.semanticscholar.org/paper/Intelligible-test-techniques-to-support-Breuer/fae0c0058c0d63cc9d9534ed8f9f92d63bd6fb07
Error-tolerance is based on the fact that many digital systems exhibit acceptable behavior even though they contain defects and occasionally output errors. A radically new test methodology, called intelligible testing, is required to support error-tolerance. This paper addresses parts of this methodology.
https://www.researchgate.net/publication/3153265_An_Error_Rate_Based_Test_Methodology_to_Support_Error-Tolerance
Testing to support error-tolerance involves new ATPG tools, new fault simulators, and new DFT and BIST techniques. View Show abstract An ATPG for threshold testing; Obtaining acceptable yield in ...
https://dl.acm.org/doi/10.5555/1266366.1266717
Reduction of detected acceptable faults for yield improvement via error-tolerance. Share on. Authors: Tong-Yu Hsieh. National Cheng Kung University, Tainan, Taiwan. National Cheng Kung University, Tainan, Taiwan. View Profile, Kuen-Jong Lee.
https://www.researchgate.net/publication/4143654_Let's_think_analog
We introduce the concept of error-tolerance, and mention related issues needed to support this concept, including ways for specifying performance, design techniques that consider yield, test ...
http://users.ece.utexas.edu/~michael/ETS2013.pdf
[42] M.A. Breuer, “Intelligible test techniques to support error-tolerance,” in Proc. IEEE Asian Test Symposium, pp. 386-393, 2004. [43] I. Chong, H. Cheong, and Antonio Ortega, “New quality metric for multimedia compression using faulty hardware,” in Int’l Workshop on Video Processing and Quality Metrics for Consumer Electronics, 2006.
http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=4459841&arnumber=4453874&count=31&index=24
Abstract: Error-tolerance is an innovative technique to address the problem of low yields in nanometer very large scale integrated (VLSI) circuitry, which is the backbone of the system-on-a-chip (SOC) revolution. The basic principle of error-tolerance is that some chips may occasionally produce erroneous outputs, but still provide acceptable ...
https://ieeexplore.ieee.org/document/1617575/
Abstract: The main objective of error-tolerance is to increase the effective yield of a process by identifying defective but acceptable chips. In this paper, we propose an error-oriented test methodology to support error-tolerance in scan-based digital circuits.
https://link.springer.com/article/10.1007/s10836-013-5357-0
Mar 08, 2013 · Hsieh T-Y, Lee K-J, Breuer MA (2006) An error-oriented test methodology to improve yield with error-tolerance. Proc. 24th VLSI test symposium, 30 …Cited by: 2
https://www.researchgate.net/publication/315458654_Design_Accuracy-Configurable_Full_Adders_for_Digital_Signal_Processing_Applications
Design Accuracy-Configurable Full Adders for Digital Signal Processing Applications ... Intelligible test techniques to support error-tolerance. ... Testing to support error-tolerance involves new ...
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